J. Nick Koston dcf2697a2a Group component tests to reduce CI time (#11134)

2025-10-12 07:21:45 +13:00

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bk72xx-ard.yaml

Group component tests to reduce CI time (#11134)

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esp32-ard.yaml

Group component tests to reduce CI time (#11134)

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esp32-c3-ard.yaml

Group component tests to reduce CI time (#11134)

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esp32-c3-idf.yaml

Group component tests to reduce CI time (#11134)

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esp32-idf.yaml

Group component tests to reduce CI time (#11134)

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esp32-p4-idf.yaml

Group component tests to reduce CI time (#11134)

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esp32-s2-ard.yaml

Group component tests to reduce CI time (#11134)

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esp32-s2-idf.yaml

Group component tests to reduce CI time (#11134)

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esp32-s3-ard.yaml

Group component tests to reduce CI time (#11134)

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esp32-s3-idf.yaml

Group component tests to reduce CI time (#11134)

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esp8266-ard.yaml

Group component tests to reduce CI time (#11134)

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rp2040-ard.yaml

Group component tests to reduce CI time (#11134)

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