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	Group component tests to reduce CI time (#11134)
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		| @@ -0,0 +1,12 @@ | ||||
| # Common UART configuration for ESP32 IDF tests - 115200 baud | ||||
| # For components that require UART baud rate 115200 (bl0906) | ||||
|  | ||||
| substitutions: | ||||
|   tx_pin: GPIO17 | ||||
|   rx_pin: GPIO16 | ||||
|  | ||||
| uart: | ||||
|   - id: uart_bus | ||||
|     tx_pin: ${tx_pin} | ||||
|     rx_pin: ${rx_pin} | ||||
|     baud_rate: 115200 | ||||
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