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	Group component tests to reduce CI time (#11134)
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								tests/test_build_components/common/i2c/esp32-s3-idf.yaml
									
									
									
									
									
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								tests/test_build_components/common/i2c/esp32-s3-idf.yaml
									
									
									
									
									
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| # Common I2C configuration for ESP32-S3 IDF tests | ||||
|  | ||||
| substitutions: | ||||
|   scl_pin: GPIO9 | ||||
|   sda_pin: GPIO8 | ||||
|  | ||||
| i2c: | ||||
|   - id: i2c_bus | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|     scan: true | ||||
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