Group component tests to reduce CI time (#11134)

2025-10-30 22:53:59 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/test_build_components/common/camera/esp32-idf.yaml
+++ b/tests/test_build_components/common/camera/esp32-idf.yaml
@@ -0,0 +1,29 @@
+esp32_camera:
+  name: ESP32 Camera
+  data_pins:
+    - number: 17
+    - number: 35
+    - number: 34
+    - number: 5
+    - number: 39
+    - number: 18
+    - number: 36
+    - number: 19
+  vsync_pin: 22
+  href_pin: 26
+  pixel_clock_pin: 21
+  external_clock:
+    pin: 27
+    frequency: 20MHz
+  i2c_pins:
+    sda: 25
+    scl: 23
+  reset_pin: 15
+  power_down_pin: 1
+  resolution: 640x480
+  jpeg_quality: 10
+  frame_buffer_location: PSRAM
+  on_image:
+    then:
+      - lambda: |-
+          ESP_LOGD("main", "image len=%d, data=%c", image.length, image.data[0]);