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	Group component tests to reduce CI time (#11134)
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		| @@ -1,5 +1,8 @@ | ||||
| substitutions: | ||||
|   tx_pin: GPIO17 | ||||
|   rx_pin: GPIO16 | ||||
|   tx_pin: GPIO4 | ||||
|   rx_pin: GPIO5 | ||||
|  | ||||
| packages: | ||||
|   uart: !include ../../test_build_components/common/uart/esp32-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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