Group component tests to reduce CI time (#11134)

tests/components/xpt2046/common.yaml

@@ -1,9 +1,3 @@
-spi:
-  - id: spi_xpt2046
-    clk_pin: ${clk_pin}
-    mosi_pin: ${mosi_pin}
-    miso_pin: ${miso_pin}
-
 display:
   - platform: ili9xxx
     id: xpt_display

tests/components/xpt2046/test.esp32-c3-idf.yaml

@@ -1,11 +1,10 @@
 substitutions:
-  clk_pin: GPIO4
-  mosi_pin: GPIO5
-  miso_pin: GPIO6
   dc_pin: GPIO7
   cs_pin: GPIO0
   disp_cs_pin: GPIO1
   interrupt_pin: GPIO3
   reset_pin: GPIO10
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
 
 <<: !include common.yaml

tests/components/xpt2046/test.esp32-idf.yaml

@@ -1,11 +1,11 @@
 substitutions:
-  clk_pin: GPIO17
-  mosi_pin: GPIO18
-  miso_pin: GPIO19
   dc_pin: GPIO13
   cs_pin: GPIO14
   disp_cs_pin: GPIO4
   interrupt_pin: GPIO21
   reset_pin: GPIO22
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
+
 <<: !include common.yaml

tests/components/xpt2046/test.esp8266-ard.yaml

@@ -1,5 +1,5 @@
 substitutions:
-  clk_pin: GPIO14
+  clk_pin: GPIO0
   mosi_pin: GPIO13
   miso_pin: GPIO12
   dc_pin: GPIO15
@@ -8,4 +8,7 @@ substitutions:
   interrupt_pin: GPIO5
   reset_pin: GPIO2
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/xpt2046/test.rp2040-ard.yaml

@@ -8,4 +8,7 @@ substitutions:
   interrupt_pin: GPIO2
   reset_pin: GPIO3
 
+packages:
+  spi: !include ../../test_build_components/common/spi/rp2040-ard.yaml
+
 <<: !include common.yaml