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	Group component tests to reduce CI time (#11134)
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		| @@ -3,4 +3,7 @@ substitutions: | ||||
|   inc_pin: GPIO14 | ||||
|   ud_pin: GPIO15 | ||||
|  | ||||
| packages: | ||||
|   spi: !include ../../test_build_components/common/spi/esp32-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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