Group component tests to reduce CI time (#11134)

2025-10-30 14:43:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/wk2132_spi/common.yaml
+++ b/tests/components/wk2132_spi/common.yaml
@@ -1,13 +1,6 @@
-spi:
-  id: spi_bus
-  clk_pin: ${clk_pin}
-  mosi_pin: ${mosi_pin}
-  miso_pin: ${miso_pin}
-
 wk2132_spi:
  - id: wk2132_spi_id
    cs_pin: ${cs_pin}
-    spi_id: spi_bus
    crystal: 11059200
    data_rate: 1MHz
    uart:
--- a/tests/components/wk2132_spi/test.esp32-idf.yaml
+++ b/tests/components/wk2132_spi/test.esp32-idf.yaml
@@ -1,7 +1,7 @@
 substitutions:
-  clk_pin: GPIO18
-  miso_pin: GPIO19
-  mosi_pin: GPIO23
  cs_pin: GPIO5

+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
+
 <<: !include common.yaml
--- a/tests/components/wk2132_spi/test.esp32-s3-idf.yaml
+++ b/tests/components/wk2132_spi/test.esp32-s3-idf.yaml
@@ -4,4 +4,7 @@ substitutions:
  mosi_pin: GPIO6
  cs_pin: GPIO19

+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-s3-idf.yaml
+
 <<: !include common.yaml