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	Group component tests to reduce CI time (#11134)
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		| @@ -1,14 +1,7 @@ | ||||
| i2c: | ||||
|   id: i2c_bus | ||||
|   scl: ${scl_pin} | ||||
|   sda: ${sda_pin} | ||||
|   scan: true | ||||
|   frequency: 600kHz | ||||
|  | ||||
| wk2132_i2c: | ||||
|   - id: wk2132_i2c_id | ||||
|     address: 0x70 | ||||
|     i2c_id: i2c_bus | ||||
|     address: 0x70 | ||||
|     uart: | ||||
|       - id: wk2132_id_0 | ||||
|         channel: 0 | ||||
|   | ||||
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