Group component tests to reduce CI time (#11134)

2025-10-30 06:33:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/wk2132_i2c/common.yaml
+++ b/tests/components/wk2132_i2c/common.yaml
@@ -1,14 +1,7 @@
-i2c:
-  id: i2c_bus
-  scl: ${scl_pin}
-  sda: ${sda_pin}
-  scan: true
-  frequency: 600kHz
-
 wk2132_i2c:
  - id: wk2132_i2c_id
-    address: 0x70
    i2c_id: i2c_bus
+    address: 0x70
    uart:
      - id: wk2132_id_0
        channel: 0
--- a/tests/components/wk2132_i2c/test.esp32-idf.yaml
+++ b/tests/components/wk2132_i2c/test.esp32-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO22
-  sda_pin: GPIO21
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml

 <<: !include common.yaml
--- a/tests/components/wk2132_i2c/test.esp32-s3-idf.yaml
+++ b/tests/components/wk2132_i2c/test.esp32-s3-idf.yaml
@@ -2,4 +2,7 @@ substitutions:
  scl_pin: GPIO40
  sda_pin: GPIO41

+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-s3-idf.yaml
+
 <<: !include common.yaml