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Group component tests to reduce CI time (#11134)
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@@ -9,16 +9,12 @@ esphome:
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solution: 4.0
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- ufire_ise.reset:
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i2c:
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- id: i2c_ufire_ise
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scl: ${scl_pin}
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sda: ${sda_pin}
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sensor:
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- platform: template
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id: test_sensor
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lambda: "return 21;"
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- platform: ufire_ise
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i2c_id: i2c_bus
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id: ufire_ise_sensor
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temperature_sensor: test_sensor
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ph:
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO16
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sda_pin: GPIO17
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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scl_pin: GPIO5
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sda_pin: GPIO4
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packages:
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i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
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<<: !include common.yaml
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