Group component tests to reduce CI time (#11134)

2025-10-31 07:03:55 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/ttp229_bsf/common.yaml
+++ b/tests/components/ttp229_bsf/common.yaml
@@ -1,6 +1,6 @@
 ttp229_bsf:
-  scl_pin: ${scl_pin}
-  sdo_pin: ${sdo_pin}
+  scl_pin: ${ttp229_scl_pin}
+  sdo_pin: ${ttp229_sdo_pin}

 binary_sensor:
  - platform: ttp229_bsf