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	Group component tests to reduce CI time (#11134)
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		| @@ -1,8 +1,9 @@ | ||||
| substitutions: | ||||
|   disp_reset_pin: GPIO10 | ||||
|   scl_pin: GPIO0 | ||||
|   sda_pin: GPIO1 | ||||
|   disp_reset_pin: GPIO7 | ||||
|   interrupt_pin: GPIO2 | ||||
|   reset_pin: GPIO3 | ||||
|  | ||||
| packages: | ||||
|   i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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