Group component tests to reduce CI time (#11134)

tests/components/tt21100/common.yaml

@@ -1,25 +1,24 @@
-i2c:
-  - id: i2c_tt21100
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 display:
   - platform: ssd1306_i2c
+    i2c_id: i2c_bus
     id: ssd1306_display
     model: SSD1306_128X64
     reset_pin: ${disp_reset_pin}
     pages:
-      - id: page1
+      - id: tt21100_page1
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
 
 touchscreen:
   - platform: tt21100
+    i2c_id: i2c_bus
+    id: tt21100_touchscreen
     display: ssd1306_display
     interrupt_pin: ${interrupt_pin}
     reset_pin: ${reset_pin}
 
 binary_sensor:
   - platform: tt21100
+    id: tt21100_button
     name: Home Button
     index: 1

tests/components/tt21100/test.esp32-c3-idf.yaml

@@ -1,8 +1,9 @@
 substitutions:
-  disp_reset_pin: GPIO10
-  scl_pin: GPIO0
-  sda_pin: GPIO1
+  disp_reset_pin: GPIO7
   interrupt_pin: GPIO2
   reset_pin: GPIO3
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
+
 <<: !include common.yaml

tests/components/tt21100/test.esp32-idf.yaml

@@ -1,8 +1,9 @@
 substitutions:
   disp_reset_pin: GPIO12
-  scl_pin: GPIO13
-  sda_pin: GPIO14
   interrupt_pin: GPIO15
-  reset_pin: GPIO16
+  reset_pin: GPIO4
+
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
 
 <<: !include common.yaml

tests/components/tt21100/test.esp8266-ard.yaml

@@ -1,8 +1,9 @@
 substitutions:
-  disp_reset_pin: GPIO12
-  scl_pin: GPIO13
-  sda_pin: GPIO14
+  disp_reset_pin: GPIO0
   interrupt_pin: GPIO15
   reset_pin: GPIO16
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/tt21100/test.rp2040-ard.yaml

@@ -1,8 +1,9 @@
 substitutions:
   disp_reset_pin: GPIO10
-  scl_pin: GPIO0
-  sda_pin: GPIO1
   interrupt_pin: GPIO2
   reset_pin: GPIO3
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
+
 <<: !include common.yaml