Group component tests to reduce CI time (#11134)

2025-10-30 22:53:59 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/tee501/common.yaml
+++ b/tests/components/tee501/common.yaml
@@ -1,9 +1,5 @@
-i2c:
-  - id: i2c_tee501
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 sensor:
  - platform: tee501
+    i2c_id: i2c_bus
    name: TEE501 Temperature
    address: 0x48