Group component tests to reduce CI time (#11134)

tests/components/st7789v/common.yaml

@@ -1,24 +1,20 @@
-spi:
-  - id: spi_st7789v
-    clk_pin: ${clk_pin}
-    mosi_pin: ${mosi_pin}
-
 display:
   - platform: st7789v
     model: TTGO TDisplay 135x240
     cs_pin: ${cs_pin}
     dc_pin: ${dc_pin}
     reset_pin: ${reset_pin}
+    backlight_pin: ${backlight_pin}
     pages:
-      - id: page1
+      - id: st7789v_page1
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
-      - id: page2
+      - id: st7789v_page2
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
     on_page_change:
-      from: page1
-      to: page2
+      from: st7789v_page1
+      to: st7789v_page2
       then:
         lambda: |-
           ESP_LOGD("display", "1 -> 2");