Group component tests to reduce CI time (#11134)

tests/components/ssd1327_i2c/common.yaml

@@ -1,24 +1,20 @@
-i2c:
-  - id: i2c_ssd1327_i2c
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 display:
   - platform: ssd1327_i2c
+    i2c_id: i2c_bus
     model: SSD1327_128x128
     reset_pin: ${reset_pin}
     address: 0x3C
     id: display1
     pages:
-      - id: page1
+      - id: ssd1327_i2c_page1
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
-      - id: page2
+      - id: ssd1327_i2c_page2
         lambda: |-
           it.rectangle(0, 0, 10, 10);
     on_page_change:
-      from: page1
-      to: page2
+      from: ssd1327_i2c_page1
+      to: ssd1327_i2c_page2
       then:
         lambda: |-
           ESP_LOGD("display", "1 -> 2");