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	Group component tests to reduce CI time (#11134)
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		| @@ -1,12 +1,12 @@ | ||||
| substitutions: | ||||
|   clk_pin: GPIO16 | ||||
|   mosi_pin: GPIO17 | ||||
|   miso_pin: GPIO18 | ||||
|   clock_pin: GPIO15 | ||||
|   data_pin: GPIO14 | ||||
|   latch_pin1: GPIO21 | ||||
|   oe_pin1: GPIO22 | ||||
|   latch_pin2: GPIO23 | ||||
|   oe_pin2: GPIO25 | ||||
|   latch_pin2: GPIO25 | ||||
|   oe_pin2: GPIO26 | ||||
|  | ||||
| packages: | ||||
|   spi: !include ../../test_build_components/common/spi/esp32-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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