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Group component tests to reduce CI time (#11134)
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@@ -1,10 +1,6 @@
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i2c:
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- id: i2c_sgp4x
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scl: ${scl_pin}
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sda: ${sda_pin}
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sensor:
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- platform: sgp4x
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i2c_id: i2c_bus
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voc:
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name: VOC Index
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id: sgp40_voc_index
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