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Group component tests to reduce CI time (#11134)
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@@ -1,5 +1,8 @@
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substitutions:
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tx_pin: GPIO17
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rx_pin: GPIO16
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-idf.yaml
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<<: !include common.yaml
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