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Group component tests to reduce CI time (#11134)
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@@ -1,9 +1,3 @@
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uart:
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- id: uart_sdm_sds011
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 115200
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sensor:
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- platform: sds011
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pm_2_5:
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