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Group component tests to reduce CI time (#11134)
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@@ -1,9 +1,12 @@
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substitutions:
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clk_pin: GPIO14
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mosi_pin: GPIO13
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clk_pin: GPIO0
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mosi_pin: GPIO2
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miso_pin: GPIO12
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cs_pin: GPIO5
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dc_pin: GPIO15
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reset_pin: GPIO16
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packages:
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spi: !include ../../test_build_components/common/spi/esp8266-ard.yaml
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<<: !include common.yaml
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