Group component tests to reduce CI time (#11134)

2025-10-31 07:03:55 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/pi4ioe5v6408/common.yaml
+++ b/tests/components/pi4ioe5v6408/common.yaml
@@ -1,9 +1,5 @@
-i2c:
-  id: i2c_pi4ioe5v6408
-  sda: ${i2c_sda}
-  scl: ${i2c_scl}
-
 pi4ioe5v6408:
+  i2c_id: i2c_bus
  id: pi4ioe1
  address: 0x44

--- a/tests/components/pi4ioe5v6408/test.esp32-idf.yaml
+++ b/tests/components/pi4ioe5v6408/test.esp32-idf.yaml
@@ -2,4 +2,7 @@ substitutions:
  i2c_sda: GPIO21
  i2c_scl: GPIO22

+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
+
 <<: !include common.yaml
--- a/tests/components/pi4ioe5v6408/test.rp2040-ard.yaml
+++ b/tests/components/pi4ioe5v6408/test.rp2040-ard.yaml
@@ -2,4 +2,7 @@ substitutions:
  i2c_sda: GPIO4
  i2c_scl: GPIO5

+packages:
+  i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
+
 <<: !include common.yaml