Group component tests to reduce CI time (#11134)

tests/components/pcd8544/common.yaml

@@ -1,9 +1,3 @@
-spi:
-  - id: spi_pcd8544
-    clk_pin: ${clk_pin}
-    mosi_pin: ${mosi_pin}
-    miso_pin: ${miso_pin}
-
 display:
   - platform: pcd8544
     cs_pin: ${cs_pin}

tests/components/pcd8544/test.esp32-c3-idf.yaml

@@ -1,9 +1,8 @@
 substitutions:
-  clk_pin: GPIO6
-  mosi_pin: GPIO7
-  miso_pin: GPIO5
   cs_pin: GPIO8
   dc_pin: GPIO9
   reset_pin: GPIO10
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
 
 <<: !include common.yaml

tests/components/pcd8544/test.esp32-idf.yaml

@@ -1,9 +1,9 @@
 substitutions:
-  clk_pin: GPIO16
-  mosi_pin: GPIO17
-  miso_pin: GPIO18
   cs_pin: GPIO12
   dc_pin: GPIO13
   reset_pin: GPIO14
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
+
 <<: !include common.yaml

tests/components/pcd8544/test.esp8266-ard.yaml

@@ -1,9 +1,12 @@
 substitutions:
-  clk_pin: GPIO14
-  mosi_pin: GPIO13
+  clk_pin: GPIO0
+  mosi_pin: GPIO2
   miso_pin: GPIO12
   cs_pin: GPIO5
   dc_pin: GPIO15
   reset_pin: GPIO16
 
+packages:
+  spi: !include ../../test_build_components/common/spi/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/pcd8544/test.rp2040-ard.yaml

@@ -6,4 +6,7 @@ substitutions:
   dc_pin: GPIO15
   reset_pin: GPIO16
 
+packages:
+  spi: !include ../../test_build_components/common/spi/rp2040-ard.yaml
+
 <<: !include common.yaml