Group component tests to reduce CI time (#11134)

2025-10-30 14:43:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/mipi_dsi/test.esp32-p4-idf.yaml
+++ b/tests/components/mipi_dsi/test.esp32-p4-idf.yaml
@@ -1,3 +1,6 @@
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-p4-idf.yaml
+
 esp_ldo:
  - id: ldo_id
    channel: 3
@@ -13,9 +16,3 @@ display:
    #id: backlight_id

 psram:
-
-i2c:
-  sda: GPIO7
-  scl: GPIO8
-  scan: true
-  frequency: 400kHz