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	Group component tests to reduce CI time (#11134)
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		| @@ -1,10 +1,6 @@ | ||||
| i2c: | ||||
|   - id: i2c_mcp4728 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| mcp4728: | ||||
|   - id: mcp4728_dac | ||||
|     i2c_id: i2c_bus | ||||
|  | ||||
| output: | ||||
|   - platform: mcp4728 | ||||
|   | ||||
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