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	Group component tests to reduce CI time (#11134)
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		| @@ -1,9 +1,5 @@ | ||||
| i2c: | ||||
|   - id: i2c_mcp23016 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| mcp23016: | ||||
|   i2c_id: i2c_bus | ||||
|   id: mcp23016_hub | ||||
|  | ||||
| binary_sensor: | ||||
|   | ||||
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