Group component tests to reduce CI time (#11134)

tests/components/mapping/test.esp32-c3-idf.yaml

@@ -1,10 +1,9 @@
-spi:
-  - id: spi_main_lcd
-    clk_pin: 6
-    mosi_pin: 7
-    miso_pin: 5
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
+  map: !include common.yaml
 
 display:
+  spi_id: spi_bus
   platform: ili9xxx
   id: main_lcd
   model: ili9342
@@ -12,6 +11,3 @@ display:
   dc_pin: 9
   reset_pin: 10
   invert_colors: false
-
-packages:
-  map: !include common.yaml