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Group component tests to reduce CI time (#11134)
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@@ -1,7 +1,6 @@
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sensor:
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- platform: ltr501
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address: 0x23
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i2c_id: i2c_ltr501
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type: ALS_PS
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gain: 1X
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integration_time: 100ms
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@@ -1,6 +1,4 @@
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i2c:
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- id: i2c_ltr501
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scl: 5
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sda: 4
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packages:
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i2c_low_freq: !include ../../test_build_components/common/i2c_low_freq/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,6 +1,4 @@
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i2c:
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- id: i2c_ltr501
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scl: 16
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sda: 17
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packages:
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i2c_low_freq: !include ../../test_build_components/common/i2c_low_freq/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,6 +1,4 @@
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i2c:
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- id: i2c_ltr501
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scl: 5
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sda: 4
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packages:
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i2c_low_freq: !include ../../test_build_components/common/i2c_low_freq/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,6 +1,4 @@
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i2c:
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- id: i2c_ltr501
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scl: 5
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sda: 4
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packages:
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i2c_low_freq: !include ../../test_build_components/common/i2c_low_freq/rp2040-ard.yaml
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<<: !include common.yaml
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