Group component tests to reduce CI time (#11134)

2025-10-30 22:53:59 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/ld2450/common.yaml
+++ b/tests/components/ld2450/common.yaml
@@ -1,14 +1,5 @@
-uart:
-  - id: ld2450_uart
-    tx_pin: ${tx_pin}
-    rx_pin: ${rx_pin}
-    baud_rate: 256000
-    parity: NONE
-    stop_bits: 1
-
 ld2450:
  - id: ld2450_radar
-    uart_id: ld2450_uart

 button:
  - platform: ld2450
--- a/tests/components/ld2450/test.esp32-c3-idf.yaml
+++ b/tests/components/ld2450/test.esp32-c3-idf.yaml
@@ -2,4 +2,7 @@ substitutions:
  tx_pin: GPIO4
  rx_pin: GPIO5

+packages:
+  uart: !include ../../test_build_components/common/uart/esp32-c3-idf.yaml
+
 <<: !include common.yaml
--- a/tests/components/ld2450/test.esp32-idf.yaml
+++ b/tests/components/ld2450/test.esp32-idf.yaml
@@ -1,5 +1,8 @@
 substitutions:
-  tx_pin: GPIO17
-  rx_pin: GPIO16
+  tx_pin: GPIO4
+  rx_pin: GPIO5
+
+packages:
+  uart: !include ../../test_build_components/common/uart/esp32-idf.yaml

 <<: !include common.yaml
--- a/tests/components/ld2450/test.esp8266-ard.yaml
+++ b/tests/components/ld2450/test.esp8266-ard.yaml
@@ -1,5 +1,8 @@
 substitutions:
-  tx_pin: GPIO4
-  rx_pin: GPIO5
+  tx_pin: GPIO0
+  rx_pin: GPIO2
+
+packages:
+  uart: !include ../../test_build_components/common/uart/esp8266-ard.yaml

 <<: !include common.yaml
--- a/tests/components/ld2450/test.rp2040-ard.yaml
+++ b/tests/components/ld2450/test.rp2040-ard.yaml
@@ -2,4 +2,7 @@ substitutions:
  tx_pin: GPIO4
  rx_pin: GPIO5

+packages:
+  uart: !include ../../test_build_components/common/uart/rp2040-ard.yaml
+
 <<: !include common.yaml