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	Group component tests to reduce CI time (#11134)
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		| @@ -3,7 +3,7 @@ substitutions: | ||||
|   d1_pin: GPIO13 | ||||
|   d2_pin: GPIO14 | ||||
|   d3_pin: GPIO15 | ||||
|   enable_pin: GPIO16 | ||||
|   enable_pin: GPIO4 | ||||
|   rs_pin: GPIO5 | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
| @@ -1,6 +1,6 @@ | ||||
| substitutions: | ||||
|   d0_pin: GPIO12 | ||||
|   d1_pin: GPIO13 | ||||
|   d0_pin: GPIO0 | ||||
|   d1_pin: GPIO2 | ||||
|   d2_pin: GPIO14 | ||||
|   d3_pin: GPIO15 | ||||
|   enable_pin: GPIO16 | ||||
|   | ||||
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