Group component tests to reduce CI time (#11134)

2025-10-30 06:33:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/inkplate/common.yaml
+++ b/tests/components/inkplate/common.yaml
@@ -1,13 +1,9 @@
-i2c:
-  - id: i2c_inkplate
-    scl: 16
-    sda: 17
-
 esp32:
  cpu_frequency: 240MHz

 display:
  - platform: inkplate
+    i2c_id: i2c_bus
    id: inkplate_display
    greyscale: false
    partial_updating: false
--- a/tests/components/inkplate/test.esp32-idf.yaml
+++ b/tests/components/inkplate/test.esp32-idf.yaml
@@ -1 +1,4 @@
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
+
 <<: !include common.yaml