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	Group component tests to reduce CI time (#11134)
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		| @@ -1,10 +1,6 @@ | ||||
| i2c: | ||||
|   - id: i2c_ina3221 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| sensor: | ||||
|   - platform: ina3221 | ||||
|     i2c_id: i2c_bus | ||||
|     address: 0x40 | ||||
|     channel_1: | ||||
|       shunt_resistance: 0.1 ohm | ||||
|   | ||||
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