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	Group component tests to reduce CI time (#11134)
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		| @@ -1,12 +1,10 @@ | ||||
| spi: | ||||
|   - id: spi_main_lcd | ||||
|     clk_pin: 2 | ||||
|     mosi_pin: 3 | ||||
|     miso_pin: 4 | ||||
| packages: | ||||
|   spi: !include ../../test_build_components/common/spi/rp2040-ard.yaml | ||||
|  | ||||
| display: | ||||
|   - platform: ili9xxx | ||||
|     id: main_lcd | ||||
|     spi_id: spi_bus | ||||
|     model: ili9342 | ||||
|     cs_pin: 20 | ||||
|     dc_pin: 21 | ||||
|   | ||||
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