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	Group component tests to reduce CI time (#11134)
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		| @@ -1,6 +1,4 @@ | ||||
| substitutions: | ||||
|   clk_pin: GPIO16 | ||||
|   mosi_pin: GPIO17 | ||||
|   cs_pin1: GPIO12 | ||||
|   dc_pin1: GPIO13 | ||||
|   reset_pin1: GPIO14 | ||||
| @@ -8,4 +6,7 @@ substitutions: | ||||
|   dc_pin2: GPIO26 | ||||
|   reset_pin2: GPIO27 | ||||
|  | ||||
| packages: | ||||
|   spi: !include ../../test_build_components/common/spi/esp32-idf.yaml | ||||
|  | ||||
| <<: !include common.yaml | ||||
|   | ||||
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