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Group component tests to reduce CI time (#11134)
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@@ -1,6 +1,9 @@
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substitutions:
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i2s_bclk_pin: GPIO15
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i2s_lrclk_pin: GPIO16
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i2s_mclk_pin: GPIO17
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i2s_lrclk_pin: GPIO4
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i2s_mclk_pin: GPIO5
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packages:
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spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
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<<: !include common.yaml
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