Group component tests to reduce CI time (#11134)

tests/components/gt911/test.esp8266-ard.yaml

@@ -1,24 +1,9 @@
-i2c:
-  - id: i2c_gt911
-    scl: 5
-    sda: 4
+substitutions:
+  display_reset_pin: "10"
+  interrupt_pin: "12"
+  reset_pin: "13"
 
-display:
-  - platform: ssd1306_i2c
-    id: ssd1306_display
-    model: SSD1306_128X64
-    reset_pin: 13
-    pages:
-      - id: page1
-        lambda: |-
-          it.rectangle(0, 0, it.get_width(), it.get_height());
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
 
-touchscreen:
-  - platform: gt911
-    display: ssd1306_display
-    interrupt_pin: 12
-
-binary_sensor:
-  - platform: gt911
-    id: touch_key_911
-    index: 0
+<<: !include common.yaml