Group component tests to reduce CI time (#11134)

2025-10-18 01:33:51 +01:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/gl_r01_i2c/common.yaml
+++ b/tests/components/gl_r01_i2c/common.yaml
@@ -1,12 +1,7 @@
-i2c:
-  - id: i2c_gl_r01_i2c
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 sensor:
  - platform: gl_r01_i2c
+    i2c_id: i2c_bus
    id: tof
    name: "ToF sensor"
-    i2c_id: i2c_gl_r01_i2c
    address: 0x74
    update_interval: 15s
--- a/tests/components/gl_r01_i2c/test.esp32-c3-idf.yaml
+++ b/tests/components/gl_r01_i2c/test.esp32-c3-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml

 <<: !include common.yaml
--- a/tests/components/gl_r01_i2c/test.esp32-idf.yaml
+++ b/tests/components/gl_r01_i2c/test.esp32-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO16
-  sda_pin: GPIO17
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml

 <<: !include common.yaml
--- a/tests/components/gl_r01_i2c/test.esp8266-ard.yaml
+++ b/tests/components/gl_r01_i2c/test.esp8266-ard.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml

 <<: !include common.yaml
--- a/tests/components/gl_r01_i2c/test.rp2040-ard.yaml
+++ b/tests/components/gl_r01_i2c/test.rp2040-ard.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
+packages:
+  i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml

 <<: !include common.yaml