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Group component tests to reduce CI time (#11134)

This commit is contained in:
J. Nick Koston
2025-10-11 08:21:45 -10:00
committed by GitHub
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions

View File

@@ -1,20 +1,19 @@
i2c:
- id: i2c_ft5x06
scl: ${scl_pin}
sda: ${sda_pin}
display:
- platform: ssd1306_i2c
id: ssd1306_display
i2c_id: i2c_bus
id: ft5x06_display
model: SSD1306_128X64
reset_pin: ${reset_pin}
pages:
- id: page1
- id: ft5x06_page1
lambda: |-
it.rectangle(0, 0, it.get_width(), it.get_height());
touchscreen:
- platform: ft5x06
i2c_id: i2c_bus
display: ft5x06_display
id: ft5x06_touchscreen
on_touch:
- logger.log:
format: Touch at (%d, %d)