Group component tests to reduce CI time (#11134)

tests/components/ft5x06/common.yaml

@@ -1,20 +1,19 @@
-i2c:
-  - id: i2c_ft5x06
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 display:
   - platform: ssd1306_i2c
-    id: ssd1306_display
+    i2c_id: i2c_bus
+    id: ft5x06_display
     model: SSD1306_128X64
     reset_pin: ${reset_pin}
     pages:
-      - id: page1
+      - id: ft5x06_page1
         lambda: |-
           it.rectangle(0, 0, it.get_width(), it.get_height());
 
 touchscreen:
   - platform: ft5x06
+    i2c_id: i2c_bus
+    display: ft5x06_display
+    id: ft5x06_touchscreen
     on_touch:
       - logger.log:
           format: Touch at (%d, %d)

tests/components/ft5x06/test.esp32-c3-idf.yaml

@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
   reset_pin: GPIO6
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
+
 <<: !include common.yaml

tests/components/ft5x06/test.esp32-idf.yaml

@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO16
-  sda_pin: GPIO17
   reset_pin: GPIO15
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
+
 <<: !include common.yaml

tests/components/ft5x06/test.esp8266-ard.yaml

@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
   reset_pin: GPIO15
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
+
 <<: !include common.yaml

tests/components/ft5x06/test.rp2040-ard.yaml

@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
   reset_pin: GPIO6
 
+packages:
+  i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
+
 <<: !include common.yaml