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Group component tests to reduce CI time (#11134)
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@@ -47,10 +47,6 @@ font:
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id: bdf_font
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size: 7
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i2c:
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scl: ${i2c_scl}
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sda: ${i2c_sda}
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display:
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- platform: ssd1306_i2c
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id: ssd1306_display
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@@ -1,7 +1,7 @@
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substitutions:
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i2c_scl: GPIO5
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i2c_sda: GPIO4
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display_reset_pin: GPIO3
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packages:
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common: !include common.yaml
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i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,7 +1,7 @@
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substitutions:
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i2c_scl: GPIO16
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i2c_sda: GPIO17
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display_reset_pin: GPIO13
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packages:
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common: !include common.yaml
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i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
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<<: !include common.yaml
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@@ -1,7 +1,7 @@
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substitutions:
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i2c_scl: GPIO5
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i2c_sda: GPIO4
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display_reset_pin: GPIO3
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packages:
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common: !include common.yaml
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i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,7 +1,7 @@
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substitutions:
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i2c_scl: GPIO5
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i2c_sda: GPIO4
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display_reset_pin: GPIO3
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packages:
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common: !include common.yaml
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i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
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<<: !include common.yaml
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