Group component tests to reduce CI time (#11134)

2025-10-30 14:43:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/es7243e/common.yaml
+++ b/tests/components/es7243e/common.yaml
@@ -4,11 +4,7 @@ esphome:
      - audio_adc.set_mic_gain: 0db
      - audio_adc.set_mic_gain: !lambda 'return 4;'

-i2c:
-  - id: i2c_es7243e
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 audio_adc:
  - platform: es7243e
+    i2c_id: i2c_bus
    id: es7243e_adc
--- a/tests/components/es7243e/test.esp32-c3-idf.yaml
+++ b/tests/components/es7243e/test.esp32-c3-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml

 <<: !include common.yaml
--- a/tests/components/es7243e/test.esp32-idf.yaml
+++ b/tests/components/es7243e/test.esp32-idf.yaml
@@ -1,5 +1,4 @@
-substitutions:
-  scl_pin: GPIO16
-  sda_pin: GPIO17
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml

 <<: !include common.yaml