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Group component tests to reduce CI time (#11134)
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@@ -1,9 +1,3 @@
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uart:
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- id: uart_dsmr
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 9600
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dsmr:
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decryption_key: 00112233445566778899aabbccddeeff
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max_telegram_length: 1000
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@@ -1,6 +1,7 @@
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substitutions:
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tx_pin: GPIO12
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rx_pin: GPIO14
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request_pin: GPIO15
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packages:
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uart: !include ../../test_build_components/common/uart/esp32-ard.yaml
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<<: !include common.yaml
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@@ -1,6 +1,7 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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request_pin: GPIO15
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packages:
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uart: !include ../../test_build_components/common/uart/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -1,6 +1,7 @@
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substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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request_pin: GPIO6
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packages:
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uart: !include ../../test_build_components/common/uart/rp2040-ard.yaml
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<<: !include common.yaml
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