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	Group component tests to reduce CI time (#11134)
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		| @@ -1,9 +1,5 @@ | ||||
| i2c: | ||||
|   - id: i2c_dac7678 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| dac7678: | ||||
|   i2c_id: i2c_bus | ||||
|   address: 0x4A | ||||
|   id: dac7678_hub | ||||
|   internal_reference: true | ||||
|   | ||||
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