Group component tests to reduce CI time (#11134)

2025-10-30 14:43:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/cwww/test.esp32-idf.yaml
+++ b/tests/components/cwww/test.esp32-idf.yaml
@@ -3,12 +3,15 @@ substitutions:
  pin_o1: GPIO16
  pin_o2: GPIO17

-packages:
-  device_base: !include common.yaml
-
 output:
-  - id: !extend light_output_1
+  - platform: ${light_platform}
+    id: light_output_1
+    pin: ${pin_o1}
    channel: 0
-  - id: !extend light_output_2
+  - platform: ${light_platform}
+    id: light_output_2
+    pin: ${pin_o2}
    channel: 1
    phase_angle: 180°
+
+<<: !include common.yaml