Group component tests to reduce CI time (#11134)

tests/components/cst816/common.yaml

@@ -1,15 +1,5 @@
-i2c:
-  - id: i2c_cst816
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
-spi:
-  - id: spi_ili9xxx
-    clk_pin: ${clk_pin}
-    mosi_pin: ${mosi_pin}
-
 display:
-  - id: my_display
+  - id: cst816_display
     platform: ili9xxx
     dimensions: 480x320
     model: ST7796
@@ -25,7 +15,9 @@ display:
 
 touchscreen:
   - id: ts_cst816
+    i2c_id: i2c_bus
     platform: cst816
+    display: cst816_display
     interrupt_pin: ${interrupt_pin}
     reset_pin: ${reset_pin}
     skip_probe: false
@@ -36,6 +28,7 @@ touchscreen:
 
 binary_sensor:
   - platform: touchscreen
+    touchscreen_id: ts_cst816
     name: Home Button
     use_raw: true
     x_min: 0

tests/components/cst816/test.esp32-c3-idf.yaml

@@ -1,12 +1,11 @@
 substitutions:
-  clk_pin: GPIO6
-  mosi_pin: GPIO7
-  cs_pin: GPIO8
+  cs_pin: GPIO7
   dc_pin: GPIO9
-  disp_reset_pin: GPIO10
-  scl_pin: GPIO0
-  sda_pin: GPIO1
+  disp_reset_pin: GPIO18
   interrupt_pin: GPIO2
   reset_pin: GPIO3
+packages:
+  spi: !include ../../test_build_components/common/spi/esp32-c3-idf.yaml
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
 
 <<: !include common.yaml

tests/components/cst816/test.esp32-idf.yaml

@@ -1,12 +1,12 @@
 substitutions:
-  clk_pin: GPIO0
-  mosi_pin: GPIO2
   cs_pin: GPIO4
   dc_pin: GPIO5
   disp_reset_pin: GPIO12
-  scl_pin: GPIO13
-  sda_pin: GPIO14
   interrupt_pin: GPIO15
-  reset_pin: GPIO16
+  reset_pin: GPIO25
+
+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
+  spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
 
 <<: !include common.yaml