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Group component tests to reduce CI time (#11134)
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@@ -1,10 +1,3 @@
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uart:
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- id: uart_cse7766
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tx_pin: ${tx_pin}
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rx_pin: ${rx_pin}
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baud_rate: 4800
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parity: EVEN
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sensor:
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- platform: cse7766
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voltage:
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@@ -1,5 +1,5 @@
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substitutions:
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tx_pin: GPIO7
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rx_pin: GPIO8
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packages:
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uart_4800_even: !include ../../test_build_components/common/uart_4800_even/esp32-c3-idf.yaml
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<<: !include common.yaml
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@@ -1,5 +1,4 @@
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substitutions:
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tx_pin: GPIO12
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rx_pin: GPIO14
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packages:
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uart_4800_even: !include ../../test_build_components/common/uart_4800_even/esp32-idf.yaml
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<<: !include common.yaml
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@@ -2,4 +2,7 @@ substitutions:
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tx_pin: GPIO1
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rx_pin: GPIO3
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packages:
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uart_4800_even: !include ../../test_build_components/common/uart_4800_even/esp8266-ard.yaml
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<<: !include common.yaml
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@@ -2,4 +2,7 @@ substitutions:
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tx_pin: GPIO4
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rx_pin: GPIO5
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packages:
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uart_4800_even: !include ../../test_build_components/common/uart_4800_even/rp2040-ard.yaml
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<<: !include common.yaml
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