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Group component tests to reduce CI time (#11134)

This commit is contained in:
J. Nick Koston
2025-10-11 08:21:45 -10:00
committed by GitHub
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions

View File

@@ -1,19 +1,14 @@
i2c:
- id: i2c_chsc6x
scl: 3
sda: 21
spi:
clk_pin: 16
mosi_pin: 17
packages:
i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
display:
- platform: ili9xxx
id: ili9xxx_display
model: GC9A01A
invert_colors: True
cs_pin: 18
dc_pin: 19
cs_pin: 22
dc_pin: 21
pages:
- id: page1
lambda: |-