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Group component tests to reduce CI time (#11134)
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@@ -1,19 +1,14 @@
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i2c:
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- id: i2c_chsc6x
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scl: 3
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sda: 21
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spi:
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clk_pin: 16
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mosi_pin: 17
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packages:
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i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
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spi: !include ../../test_build_components/common/spi/esp32-idf.yaml
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display:
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- platform: ili9xxx
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id: ili9xxx_display
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model: GC9A01A
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invert_colors: True
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cs_pin: 18
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dc_pin: 19
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cs_pin: 22
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dc_pin: 21
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pages:
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- id: page1
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lambda: |-
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