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	Group component tests to reduce CI time (#11134)
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		| @@ -1,20 +1,13 @@ | ||||
| i2c: | ||||
|   - id: i2c_ade7953 | ||||
|     scl: ${scl_pin} | ||||
|     sda: ${sda_pin} | ||||
|  | ||||
| sensor: | ||||
|   - platform: ade7953_i2c | ||||
|     i2c_id: i2c_bus | ||||
|     irq_pin: ${irq_pin} | ||||
|     voltage: | ||||
|       name: ADE7953 Voltage | ||||
|       id: ade7953_voltage | ||||
|     current_a: | ||||
|       name: ADE7953 Current A | ||||
|       id: ade7953_current_a | ||||
|     current_b: | ||||
|       name: ADE7953 Current B | ||||
|       id: ade7953_current_b | ||||
|     power_factor_a: | ||||
|       name: ADE7953 Power Factor A | ||||
|     power_factor_b: | ||||
|   | ||||
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