Group component tests to reduce CI time (#11134)

2025-10-30 14:43:51 +00:00 · 2025-10-11 08:21:45 -10:00
parent 6a11700a6b
commit dcf2697a2a
1808 changed files with 8564 additions and 5758 deletions
--- a/tests/components/ade7953_i2c/common.yaml
+++ b/tests/components/ade7953_i2c/common.yaml
@@ -1,20 +1,13 @@
-i2c:
-  - id: i2c_ade7953
-    scl: ${scl_pin}
-    sda: ${sda_pin}
-
 sensor:
  - platform: ade7953_i2c
+    i2c_id: i2c_bus
    irq_pin: ${irq_pin}
    voltage:
      name: ADE7953 Voltage
-      id: ade7953_voltage
    current_a:
      name: ADE7953 Current A
-      id: ade7953_current_a
    current_b:
      name: ADE7953 Current B
-      id: ade7953_current_b
    power_factor_a:
      name: ADE7953 Power Factor A
    power_factor_b:
--- a/tests/components/ade7953_i2c/test.esp32-c3-idf.yaml
+++ b/tests/components/ade7953_i2c/test.esp32-c3-idf.yaml
@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
  irq_pin: GPIO6

+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-c3-idf.yaml
+
 <<: !include common.yaml
--- a/tests/components/ade7953_i2c/test.esp32-idf.yaml
+++ b/tests/components/ade7953_i2c/test.esp32-idf.yaml
@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO16
-  sda_pin: GPIO17
  irq_pin: GPIO15

+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp32-idf.yaml
+
 <<: !include common.yaml
--- a/tests/components/ade7953_i2c/test.esp8266-ard.yaml
+++ b/tests/components/ade7953_i2c/test.esp8266-ard.yaml
@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
  irq_pin: GPIO15

+packages:
+  i2c: !include ../../test_build_components/common/i2c/esp8266-ard.yaml
+
 <<: !include common.yaml
--- a/tests/components/ade7953_i2c/test.rp2040-ard.yaml
+++ b/tests/components/ade7953_i2c/test.rp2040-ard.yaml
@@ -1,6 +1,7 @@
 substitutions:
-  scl_pin: GPIO5
-  sda_pin: GPIO4
  irq_pin: GPIO6

+packages:
+  i2c: !include ../../test_build_components/common/i2c/rp2040-ard.yaml
+
 <<: !include common.yaml